BEAM PROFILE MEASUREMENT ON THE MAGNETOELASTIC MICROSCOPE

被引：0
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作者：
BONGIANNI, WL
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1982年 / 20卷 / 04期
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D O I：
10.1116/1.571608
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：1370 / 1371
页数：2
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