IN-SITU DIRECT IMAGING OF SCANNING TUNNELING MICROSCOPE TIP APEX

被引：16
|
作者：
HEIKE, S
HASHIZUME, T
WADA, Y
机构：
[1] Advanced Research Laboratory, Hitachi, Ltd., Hatoyama, Saitama, 350-03
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1995年 / 34卷 / 8B期
关键词：
STM; TIP; SILICON; SURFACE; MANIPULATION;
D O I：
10.1143/JJAP.34.L1061
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
In situ and direct imaging of the scanning tunneling microscope (STM) tip apex is made possible by nano needle structures grown on the sample surface (needle formation and tip imaging: NFTI). The nano needle structures, which extend several nms and are sharper than the tip, are formed on the silicon(111)7 x 7 surfaces by applying high negative voltages to the tip. The relationship between the tip apex feature and the STM image is investigated and it is experimentally confirmed that an atomically sharp tip apex results in STM images with atomic resolution.
引用
收藏
页码：L1061 / L1063
页数：3
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