INTEGRATED-CIRCUIT DESIGN TRAINING AT ENSERG

被引:0
|
作者
BOUVIER, G
ROLLAND, R
LAMINE, A
机构
来源
ONDE ELECTRIQUE | 1995年 / 75卷 / 01期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The test of integrated circuits plays an important role in the integrated circuit design training at ENSERG. A good design requires a good verification. We briefly present the practical aspects of integrated circuit design teaching for engineers in electronics who will, or will not become microelectronics specialists. All circuits are concerned by testing irrespective of the design methodology : standard cells, gate arrays designed by the students of the second year and the full-custom circuits from the third-year students in microelectronics. These tests require an important preparation work and a perfect mastery of the tester, that is why the Centre Interuniversitaire Micro-Electronique (CIME) allocates a specialized engineer in this domain to help students and professors. Two testers are available at CIME : Genrad GR125, and Tektronix LV500. We present the flowchart of this teaching practice in order to make it compatible with the knowledge of the two classes and we present the results obtained after several years of practice.
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页码:18 / 21
页数:4
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