SUBMICRON PROBE OF POLYMER ADHESION WITH ATOMIC FORCE MICROSCOPY - DEPENDENCE ON TOPOGRAPHY AND MATERIAL INHOMOGENEITIES

被引：125

作者：

MIZES, HA

LOH, KG

MILLER, RJD

AHUJA, SK

GRABOWSKI, EF

机构：

[1] UNIV ROCHESTER,DEPT MECH ENGN,ROCHESTER,NY 14624

[2] UNIV ROCHESTER,DEPT CHEM,ROCHESTER,NY 14624

[3] XEROX CORP,DEV & MFG,WEBSTER,NY 14580

来源：

APPLIED PHYSICS LETTERS | 1991年 / 59卷 / 22期

关键词：

D O I：

10.1063/1.105846

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have used the atomic force microscope as a nanoindenter to both doped and undoped polycarbonate to probe the dependence of adhesion on topography and material inhomogeneities. Adhesion measurements at the same position are repeatable to 2%. The magnitude of the adhesion is found to decrease as the local curvature on the surface increases. Spatial adhesion maps of doped polymers show structure that is not apparent in surface topography. The spatial resolution of the measurement is at least 300 angstrom.

引用

页码：2901 / 2903

页数：3

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