FIELD-ION MICROSCOPE OBSERVATIONS OF HELIUM ION-BOMBARDMENT DAMAGE IN TUNGSTEN

被引：25

作者：

WALLS, JM

BOOTHBY, RM

SOUTHWORTH, HN

机构：

[1] LOUGHBOROUGH UNIV TECHNOL,DEPT PHYS,LOUGHBOROUGH LE11 3TU,LEICESTERSHIRE,ENGLAND

[2] AERE,DIV MET,HARWELL DIDCOT,BERKSHIRE,ENGLAND

[3] UNIV BIRMINGHAM,DEPT PHYS MET & SCI MAT,BIRMINGHAM B15 2TT,WARWICKSHIRE,ENGLAND

来源：

SURFACE SCIENCE | 1976年 / 61卷 / 02期

关键词：

D O I：

10.1016/0039-6028(76)90055-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：419 / 434

页数：16

共 50 条

[1] IN-SITU CLEANING OF SPECIMENS IN FIELD-ION MICROSCOPE BY ARGON ION-BOMBARDMENT
CRANSTOUN, GK
BROWNING, DJ
PYKE, DR
[J]. SURFACE SCIENCE, 1973, 34 (03) : 597 - 612
[2] FIELD-ION MICROSCOPE OBSERVATIONS OF SPUTTERED TUNGSTEN SURFACES
WALLS, JM
BRAUN, E
SOUTHWORTH, HN
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, : 355 - 358
[3] OBSERVATIONS OF SPUTTERING DAMAGE USING FIELD-ION MICROSCOPE
WALLS, JM
SOUTHWORTH, HN
BRAUN, E
[J]. VACUUM, 1974, 24 (10) : 471 - 474
[4] COMMENTS ON FIELD-ION MICROSCOPE OBSERVATIONS OF STACKING FAULTS IN TUNGSTEN
RANGANATHAN, S
[J]. JOURNAL OF THE LESS-COMMON METALS, 1966, 10 (05): : 368 - +
[5] A STUDY OF FISSION FRAGMENT DAMAGE IN TUNGSTEN WITH FIELD-ION MICROSCOPE
BOWKETT, KM
CHADDERTON, LT
NORDEN, H
RALPH, B
[J]. PHILOSOPHICAL MAGAZINE, 1965, 11 (111) : 651 - +
[6] LIQUID HELIUM FIELD-ION MICROSCOPE FOR RADIATION DAMAGE INVESTIGATIONS
PETROFF, P
WASHBURN, J
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (03): : 317 - &
[7] INSITU FIELD-ION MICROSCOPE RESEARCH OF RADIATION-DAMAGE IN TUNGSTEN
TAMAKI, S
[J]. JOURNAL OF MICROSCOPY-OXFORD, 1976, 106 (APR): : 311 - 323
[8] EFFECT OF NEON ON HELIUM ION IMAGING IN FIELD-ION MICROSCOPE
JANSSEN, AP
JONES, JP
[J]. SURFACE SCIENCE, 1972, 33 (03) : 553 - &
[9] PREPARATION OF TUNGSTEN SPECIMENS FOR FIELD-ION MICROSCOPE
FASTH, JE
LOBERG, B
NORDEN, H
[J]. ARKIV FOR FYSIK, 1968, 37 (04): : 361 - &
[10] A FIELD-ION MICROSCOPY STUDY OF ION DAMAGE TO TUNGSTEN
FARNUM, DJ
INAL, OT
WALKO, RJ
[J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1983, 80 (01): : 287 - 303

← 1 2 3 4 5 →