SOME PROCESS CAPABILITY INDEXES ARE MORE RELIABLE THAN ONE MIGHT THINK

被引：0
|
作者：
KOTZ, S
PEARN, WL
JOHNSON, NL
机构：
[1] UNIV N CAROLINA, CHAPEL HILL, NC 27514 USA
[2] NATL CHIAO TUNG UNIV, HSINCHU, TAIWAN
来源：
JOURNAL OF THE ROYAL STATISTICAL SOCIETY SERIES C-APPLIED STATISTICS | 1993年 / 42卷 / 01期
关键词：
CAPABILITY INDEXES; NONCENTRAL CHI-2-DISTRIBUTION; STANDARD ERROR; STIRLING APPROXIMATION;
D O I：
暂无
中图分类号：
O21 [概率论与数理统计]; C8 [统计学];
学科分类号：
020208 ; 070103 ; 0714 ;
摘要：
In this paper we obtain formulae for exact expected values and standard deviations of estimators of certain process capability indices discussed by Bissell. In particular, we show that for the index C(pk) Bissell's formula gives values for the standard deviation which are too high especially when the actual population mean value is close to (or equal to) the average of the upper and lower specification limits.
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页码：55 / 62
页数：8
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