Predicting software defect type using concept-based classification

被引:0
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作者
Sangameshwar Patil
B. Ravindran
机构
[1] IIT Madras,Department of Computer Science & Engineering
[2] TCS Research,Robert Bosch Center for Data Science and AI
[3] IIT Madras,undefined
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关键词
Software defect classification; Software defect management; Natural language processing; Explicit semantic analysis; Orthogonal defect classification;
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摘要
Automatically predicting the defect type of a software defect from its description can significantly speed up and improve the software defect management process. A major challenge for the supervised learning based current approaches for this task is the need for labeled training data. Creating such data is an expensive and effort-intensive task requiring domain-specific expertise. In this paper, we propose to circumvent this problem by carrying out concept-based classification (CBC) of software defect reports with help of the Explicit Semantic Analysis (ESA) framework. We first create the concept-based representations of a software defect report and the defect types in the software defect classification scheme by projecting their textual descriptions into a concept-space spanned by the Wikipedia articles. Then, we compute the “semantic” similarity between these concept-based representations and assign the software defect type that has the highest similarity with the defect report. The proposed approach achieves accuracy comparable to the state-of-the-art semi-supervised and active learning approach for this task without requiring labeled training data. Additional advantages of the CBC approach are: (i) unlike the state-of-the-art, it does not need the source code used to fix a software defect, and (ii) it does not suffer from the class-imbalance problem faced by the supervised learning paradigm.
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页码:1341 / 1378
页数:37
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