Non-volatile memory based on the ferroelectric photovoltaic effect

被引:0
|
作者
Rui Guo
Lu You
Yang Zhou
Zhi Shiuh Lim
Xi Zou
Lang Chen
R. Ramesh
Junling Wang
机构
[1] School of Materials Science and Engineering,Department of Materials Science and Engineering, and Department of Physics
[2] Nanyang Technological University,undefined
[3] University of California,undefined
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
The quest for a solid state universal memory with high-storage density, high read/write speed, random access and non-volatility has triggered intense research into new materials and novel device architectures. Though the non-volatile memory market is dominated by flash memory now, it has very low operation speed with ~10 μs programming and ~10 ms erasing time. Furthermore, it can only withstand ~105 rewriting cycles, which prevents it from becoming the universal memory. Here we demonstrate that the significant photovoltaic effect of a ferroelectric material, such as BiFeO3 with a band gap in the visible range, can be used to sense the polarization direction non-destructively in a ferroelectric memory. A prototype 16-cell memory based on the cross-bar architecture has been prepared and tested, demonstrating the feasibility of this technique.
引用
收藏
相关论文
共 50 条
  • [1] Non-volatile memory based on the ferroelectric photovoltaic effect
    Guo, Rui
    You, Lu
    Zhou, Yang
    Lim, Zhi Shiuh
    Zou, Xi
    Chen, Lang
    Ramesh, R.
    Wang, Junling
    [J]. NATURE COMMUNICATIONS, 2013, 4
  • [2] Organic Non-volatile Memory Devices Based on a Ferroelectric Polymer
    Kalbitz, R.
    Fruebing, P.
    Gerhard, R.
    Taylor, D. M.
    [J]. 2011 14TH INTERNATIONAL SYMPOSIUM ON ELECTRETS (ISE), 2011, : 207 - +
  • [3] A ferroelectric fin diode for robust non-volatile memory
    Guangdi Feng
    Qiuxiang Zhu
    Xuefeng Liu
    Luqiu Chen
    Xiaoming Zhao
    Jianquan Liu
    Shaobing Xiong
    Kexiang Shan
    Zhenzhong Yang
    Qinye Bao
    Fangyu Yue
    Hui Peng
    Rong Huang
    Xiaodong Tang
    Jie Jiang
    Wei Tang
    Xiaojun Guo
    Jianlu Wang
    Anquan Jiang
    Brahim Dkhil
    Bobo Tian
    Junhao Chu
    Chungang Duan
    [J]. Nature Communications, 15
  • [4] Retention Analysis of a Non-Volatile Ferroelectric Memory Device
    John, Caroline S.
    Macleod, Todd C.
    Evans, Joe
    Ho, Fat D.
    [J]. INTEGRATED FERROELECTRICS, 2012, 140 : 23 - 34
  • [5] A ferroelectric fin diode for robust non-volatile memory
    Feng, Guangdi
    Zhu, Qiuxiang
    Liu, Xuefeng
    Chen, Luqiu
    Zhao, Xiaoming
    Liu, Jianquan
    Xiong, Shaobing
    Shan, Kexiang
    Yang, Zhenzhong
    Bao, Qinye
    Yue, Fangyu
    Peng, Hui
    Huang, Rong
    Tang, Xiaodong
    Jiang, Jie
    Tang, Wei
    Guo, Xiaojun
    Wang, Jianlu
    Jiang, Anquan
    Dkhil, Brahim
    Tian, Bobo
    Chu, Junhao
    Duan, Chungang
    [J]. NATURE COMMUNICATIONS, 2024, 15 (01)
  • [6] Characterization of an Autonomous Non-Volatile Ferroelectric Memory Latch
    John, Caroline S.
    MacLeod, Todd C.
    Evans, Joe
    Ho, Fat D.
    [J]. INTEGRATED FERROELECTRICS, 2012, 132 : 76 - 81
  • [7] Overview: Ferroelectric non-volatile memory research at NEC
    Abe, H
    Endo, N
    Watanabe, H
    [J]. NEC RESEARCH & DEVELOPMENT, 1999, 40 (02): : 203 - 205
  • [8] Ferroelectric polymers for non-volatile memory devices: a review
    Li, Huilin
    Wang, Ruopeng
    Han, Su-Ting
    Zhou, Ye
    [J]. POLYMER INTERNATIONAL, 2020, 69 (06) : 533 - 544
  • [9] Lead based ferroelectric capacitors for low voltage non-volatile memory applications
    Aggarwal, S
    Prakash, AS
    Song, TK
    Sadashivan, S
    Dhote, AM
    Yang, B
    Ramesh, R
    Kisler, Y
    Bernacki, SE
    [J]. INTEGRATED FERROELECTRICS, 1998, 19 (1-4) : 159 - 177
  • [10] Non-volatile memory based on nanostructures
    Kalinin, Sergei
    Yang, J. Joshua
    Demming, Anna
    [J]. NANOTECHNOLOGY, 2011, 22 (25)