X-ray diffraction study of (TlInSe2)1−x(TlGaTe2)x crystal system

被引：0
|
作者：
A. U. Sheleg
E. M. Zub
A. Ya. Yachkovskii
S. N. Mustafaeva
E. M. Kerimova
机构：
[1] National Academy of Sciences of Belarus,State Scientific and Production Association, Scientific and Practical Materials Research Center
[2] Azerbaijan National Academy of Sciences,Institute of Physics
来源：
Crystallography Reports | 2012年 / 57卷
关键词：
Unit Cell Parameter; Crystallography Report; Approximation Curve; Unit Cell Volume Versus; Full Profile Rietveld Analysis;
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摘要：
The crystallographic and dynamic characteristics of TlInSe2 and TlGaTe2 crystals have been studied by X-ray diffraction in the temperature range of 85–320 K. The temperature dependences of the unit-cell parameters a of TlInSe2 and TlGaTe2 crystals, as well as their coefficients of thermal expansion along the [100] direction, are determined. The concentration dependences of the unit-cell parameters a and c for (TlInSe2)1 − x(TlGaTe2)x crystals are measured. Anomalies are found in the temperature dependences of the unit-cell parameters a and, correspondingly, the coefficient of thermal expansion, indicating the existence of phase transitions in TlInSe2 and TlGaTe2 crystals.
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页码：283 / 285
页数：2
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