The application of back-scattered electron imaging for characterization of pearlitic steels
被引:0
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作者:
Ning Guo
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机构:Chongqing University,Department of Materials Science and Engineering
Ning Guo
Qing Liu
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机构:Chongqing University,Department of Materials Science and Engineering
Qing Liu
YunChang Xin
论文数: 0引用数: 0
h-index: 0
机构:Chongqing University,Department of Materials Science and Engineering
YunChang Xin
BaiFeng Luan
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h-index: 0
机构:Chongqing University,Department of Materials Science and Engineering
BaiFeng Luan
Zheng Zhou
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h-index: 0
机构:Chongqing University,Department of Materials Science and Engineering
Zheng Zhou
机构:
[1] Chongqing University,Department of Materials Science and Engineering
来源:
Science China Technological Sciences
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2011年
/
54卷
关键词:
pearlitic steels;
microstructures;
back-scattered electron imaging (BSEI);
cold drawing;
D O I:
暂无
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学科分类号:
摘要:
The microstructures of pearlitic steel wire rods and steel wires are commonly characterized by secondary electron imaging (SEI) technique using scanning electron microscopy (SEM). In this work, a back-scattered electron imaging (BSEI) method is proposed to determine the microstructures of undeformed and deformed pearlitic steels with nanometer scale pearlite lamellae. The results indicate that BSEI technique can characterize the pearlite lamellas veritably and is effective in quantitative measurement of the mean size of pearlite interlamellar spacing. To some extent, BSEI method is more suitable than SEI technique for studying undeformed and not severely deformed pearlitic steels.