Recent progress in single crystal perovskite X-ray detectors

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作者
Xiao Liu
Jun Ren
Yu-Ang Chen
Xiangshun Geng
Dan Xie
Tian-Ling Ren
机构
[1] Tsinghua University,Beijing National Research Center for Information Science and Technology (BNRist), School of Integrated Circuits
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single crystal perovskites; carrier transport; radiation detection; X-ray detectors; X-ray imaging;
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摘要
Perovskites have attracted extensive attention as radiation detection material due to their long carrier diffusion length and lifetime, high absorption coefficient, and flexible manufacturing process. Compared with polycrystalline structures, single crystal perovskites improve the performance of optoelectronic devices due to their low defect state density, better photoelectric characteristics, and chemical stability. Herein, we review the recent progress of single crystal perovskite X-ray detectors. First, we briefly introduced the basic concepts, detection mechanisms, figure of merits of perovskite X-ray detectors, and the preparation methods of single crystal perovskites. Then, we summarized the significant advancements in single crystal perovskite X-ray detectors in recent times. Finally, we discussed the critical challenges and some practicable solutions for developing high-performance X-ray detectors.
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