Method of radiational identification of a plant and characterization of integrated circuit technology

被引：0
|
作者：
Sogoyan A.V. [1 ,2 ]
Davydov G.G. [1 ,2 ]
Artamonov A.S. [1 ,2 ]
Kolosova A.S. [1 ,2 ]
Telets V.A. [1 ,2 ]
Nikiforrov A.Y. [1 ,2 ]
Ozhegin Y.A. [1 ,2 ]
Kameneva A.S. [1 ,2 ]
Moskovskaya Y.M. [1 ,2 ]
机构：
[1] National Research Nuclear University MEPhI, Moscow
[2] AO Experimental Research and Production Association Specialized Electronic Systems, Moscow
来源：
Russian Microelectronics | 2017年 / 46卷 / 4期
关键词：
D O I：
10.1134/S1063739717040096
中图分类号：
学科分类号：
摘要：
A methodical approach for the identification of a plant and characterization of integrated circuit technology based on an analysis of the features of a radiation response is proposed. © 2017, Pleiades Publishing, Ltd.
引用
收藏
页码：290 / 296
页数：6
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