Micromechanical characterization of thermomechanically fatigued lead-free solder joints

被引:0
|
作者
H. Rhee
J. P. Lucas
K. N. Subramanian
机构
[1] Michigan State University,Department of Chemical Engineering and Materials Science
关键词
Fatigue; Solder Joint; Ternary Alloy; Creep Behavior; Stress Exponent;
D O I
暂无
中图分类号
学科分类号
摘要
Nanoindentation testing (NIT) was used to investigate micromechanical properties of (i) as-fabricated, (ii) thermomechanically fatigued (TMF), and (iii) TMF and crept lead-free solder joints. NIT also served to generate information for a database on lead-free solder joints. Sn–Ag-based solder materials used in this study included a binary eutectic alloy, one ternary alloy, and two quaternary alloys. TMF solder joints were thermally cycled for 0, 250, 500, 1000 cycles between −15 and 150 °C. Using NIT, mechanical properties such as hardness, elastic modulus, strength trends, creep behavior, and stress exponent for power-law creep were obtained on small (nominally, 100 μm thick) solder joints. Because the volume of material probed by the indenter during NIT is small and highly localized, the properties observed depended strongly on the particular joint microstructure of the indent location. Scanning electron microscopy (SEM) was used to image the nanoindents and monitor deformation and fracture events that resulted from the indenting.
引用
下载
收藏
页码:477 / 484
页数:7
相关论文
共 50 条
  • [1] Micromechanical characterization of thermomechanically fatigued lead-free solder joints
    Rhee, H
    Lucas, JP
    Subramanian, KN
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2002, 13 (08) : 477 - 484
  • [2] Thermomigration in lead-free solder joints
    Abdulhamid, Mohd F.
    Li, Shidong
    Basaran, Cemal
    International Journal of Materials and Structural Integrity, 2008, 2 (1-2) : 11 - 34
  • [3] Reliability of solder joints assembled with lead-free solder
    Ochiai, Masayuki
    Akamatsu, Toshiya
    Ueda, Hidefumi
    2002, Fujitsu Ltd (38):
  • [4] Reliability of solder joints assembled with lead-free solder
    Ochiai, M
    Akamatsu, T
    Ueda, H
    FUJITSU SCIENTIFIC & TECHNICAL JOURNAL, 2002, 38 (01): : 96 - 101
  • [5] Incremental recrystallization/grain growth driven by elastic strain energy release in a thermomechanically fatigued lead-free solder joint
    Telang, A. U.
    Bieler, T. R.
    Zamiri, A.
    Pourboghrat, F.
    ACTA MATERIALIA, 2007, 55 (07) : 2265 - 2277
  • [6] Microstructural characterization of damage in thermomechanically fatigued Sn-Ag based solder joints
    Choi, S
    Lee, JG
    Subramanian, KN
    Lucas, JP
    Bieler, TR
    JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (04) : 292 - 297
  • [7] Microstructural characterization of damage in thermomechanically fatigued Sn-Ag based solder joints
    S. Choi
    J. G. Lee
    K. N. Subramanian
    J. P. Lucas
    T. R. Bieler
    Journal of Electronic Materials, 2002, 31 : 292 - 297
  • [8] Electromigration issues in lead-free solder joints
    Chih Chen
    S. W. Liang
    Journal of Materials Science: Materials in Electronics, 2007, 18 : 259 - 268
  • [9] The creep properties of lead-free solder joints
    H. G Song
    J. W. Morris
    F. Hua
    JOM, 2002, 54 : 30 - 32
  • [10] The creep properties of lead-free solder joints
    Song, HG
    Morris, JW
    Hua, F
    JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, 2002, 54 (06): : 30 - 32