共 50 条
- [6] Study of the Si(111)√3×√3-Sb structure by x-ray diffraction Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1992, 31 (4 A): : 426 - 428
- [7] High resolution x-ray diffraction and x-ray topography study of GaN on Al2O3 WIDE-BANDGAP SEMICONDUCTORS FOR HIGH POWER, HIGH FREQUENCY AND HIGH TEMPERATURE, 1998, 512 : 315 - 320
- [9] X-ray powder diffraction data and structural parameters for compound NdFe0.6Sb2 Rare Met, 2 (128-132):