Timing Jitter Measurement of Intrinsic Random Jitter and Sinusoidal Jitter Using Frequency Division

被引：0

作者：

Takahiro J. Yamaguchi

Masahiro Ishida

Mani Soma

Louis Malarsie

Hirobumi Musha

机构：

[1] Advantest Laboratories Ltd.,Department of Electrical Engineering

[2] University of Washington,undefined

[3] Agere Systems,undefined

[4] Advantest Corporation,undefined

来源：

Journal of Electronic Testing | 2003年 / 19卷

关键词：

communication devices test; high frequency test; jitter test; timing jitter;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

This paper presents a new method for measuring random timing jitter or sinusoidal timing jitter in signals of telecommunication devices. The method uses a divide-by-M circuit to reduce the frequency and the number of clock samples, and applies the Hilbert transform to measure the timing jitter. This new frequency division method is validated with experimental data from a serializer-deserializer device and a modulated signal source generating a 2.5 GHz FM signal.

引用

页码：183 / 193

页数：10

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