Optical emission of cdse nanocrystals induced by the electrical current of a scanning tunneling microscope

被引：0
|
作者：
I. S. Ezubchenko
A. S. Trifonov
I. S. Osad’ko
I. G. Prokhorova
O. V. Snigirev
E. S. Soldatov
机构：
[1] Ezubchenko, I.S.
[2] Trifonov, A.S.
[3] Osad'koc, I.S.
[4] Prokhorova, I.G.
[5] Snigirev, O.V.
[6] Soldatov, E.S.
来源：
Ezubchenko, I.S. (Artemt73@gmail.com) | 1600年 / Allerton Press Incorporation卷 / 76期
关键词：
Electroluminescence;
D O I：
10.3103/S1062873812120088
中图分类号：
学科分类号：
摘要：
Electroluminescence from a single CdSe nanocrystal (NC) excited by the tunneling current of a scanning tunneling microscope (STM) is measured. Such samples produce no plasmon emissions. This allows us to measure pure signals from nanocrystals. The time dependence of electroluminescence differs from the photoluminescence of an identical nanocrystal because of different physical processes of excitation.
引用
收藏
页码：1310 / 1312
页数：2
相关论文
共 50 条
  • [1] Electroluminescence of single CdSe nanocrystals induced by scanning tunneling microscope
    Trifonov, A. S.
    Osad'ko, I. S.
    Ezubchenko, I. S.
    Prokhorova, I. G.
    Snigirev, O. V.
    OPTICS COMMUNICATIONS, 2012, 285 (07) : 1997 - 2000
  • [2] Fluctuations of electroluminescence intensity of single CdSe nanocrystals excited by scanning tunneling microscope current
    Osad'ko, I. S.
    Trifonov, A. S.
    Ezubchenko, I. S.
    Prokhorova, I. G.
    SURFACE SCIENCE, 2012, 606 (3-4) : 394 - 400
  • [3] Photon emission induced by the scanning tunneling microscope
    Berndt, R
    Bohringer, M
    LASER TECHNIQUES FOR SURFACE SCIENCE III, 1998, 3272 : 66 - 72
  • [4] Electrical characterization of ZnO ceramics by scanning tunneling spectroscopy and beam-induced current in the scanning tunneling microscope
    Díaz-Guerra, C
    Piqueras, J
    JOURNAL OF APPLIED PHYSICS, 1999, 86 (04) : 1874 - 1877
  • [5] PHOTON-EMISSION INDUCED BY THE SCANNING TUNNELING MICROSCOPE
    BERNDT, R
    SCANNING MICROSCOPY, 1995, 9 (03) : 687 - 693
  • [6] Optical selection rules in light emission from the scanning tunneling microscope
    Sakurai, M
    Thirstrup, C
    Aono, M
    PHYSICAL REVIEW LETTERS, 2004, 93 (04) : 046102 - 1
  • [7] A SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING FIELD-EMISSION MICROSCOPE
    EMCH, R
    NIEDERMANN, P
    DESCOUTS, P
    FISCHER, O
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 379 - 379
  • [8] SIMULATION OF CURRENT IN THE SCANNING TUNNELING MICROSCOPE
    LALOYAUX, T
    DERYCKE, I
    VIGNERON, JP
    LAMBIN, P
    LUCAS, AA
    PHYSICAL REVIEW B, 1993, 47 (12): : 7508 - 7518
  • [9] CURRENT CHARACTERISTICS FOR THE SCANNING TUNNELING MICROSCOPE
    STAMP, AP
    MCINTOSH, GC
    LIU, XW
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03): : 2175 - 2178
  • [10] PHOTON-EMISSION AT MOLECULAR RESOLUTION INDUCED BY A SCANNING TUNNELING MICROSCOPE
    BERNDT, R
    GAISCH, R
    GIMZEWSKI, JK
    REIHL, B
    SCHLITTLER, RR
    SCHNEIDER, WD
    TSCHUDY, M
    SCIENCE, 1993, 262 (5138) : 1425 - 1427
12345