Lamellar Thickness of a Syndiotactic Polystyrene Determined from Small-angle X-ray Scattering and Transmission Electron Microscopy

被引：0
|
作者：
Wei-Po Liao
Tsang-Lang Lin
E. M. Woo
Chi Wang
机构：
[1] National Cheng Kung University,Department of Chemical Engineering
[2] National Tsing Hua University,Department of Engineering and System Science
来源：
Journal of Polymer Research | 2002年 / 9卷
关键词：
lamellar; morphology; SAXS; syndiotactic polystyrene;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Extensive morphological studies on a syndiotactic polystyrene (sPS) sample prepared from compression molding were carried out using small-angle X-ray scattering (SAXS) and transmission electron microscopy (TEM). SAXS was conducted at 25 ○C as well as at 150 ○C to enhance the scattering contrast in order to obtain more reliable morphological parameters. The compression-molded sample was crystallized into a β′ orthorhombic crystal lattice characterized by wide-angle X-ray diffraction (WAXD). A similar weight fraction of crystallinity, ca. 0.37, was obtained from both WAXD and differential scanning calorimetry measurements.
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页码：91 / 96
页数：5
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