Nanofocusing of hard X-ray free electron laser pulses using diamond based Fresnel zone plates

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作者
C. David
S. Gorelick
S. Rutishauser
J. Krzywinski
J. Vila-Comamala
V. A. Guzenko
O. Bunk
E. Färm
M. Ritala
M. Cammarata
D. M. Fritz
R. Barrett
L. Samoylova
J. Grünert
H. Sinn
机构
[1] Paul Scherrer Institut,Department of Chemistry
[2] SLAC National Accelerator Laboratory,undefined
[3] University of Helsinki,undefined
[4] European Synchrotron Radiation Facility,undefined
[5] European XFEL,undefined
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摘要
A growing number of X-ray sources based on the free-electron laser (XFEL) principle are presently under construction or have recently started operation. The intense, ultrashort pulses of these sources will enable new insights in many different fields of science. A key problem is to provide x-ray optical elements capable of collecting the largest possible fraction of the radiation and to focus into the smallest possible focus. As a key step towards this goal, we demonstrate here the first nanofocusing of hard XFEL pulses. We developed diamond based Fresnel zone plates capable of withstanding the full beam of the world's most powerful x-ray laser. Using an imprint technique, we measured the focal spot size, which was limited to 320 nm FWHM by the spectral band width of the source. A peak power density in the focal spot of 4×1017 W/cm2 was obtained at 70 fs pulse length.
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