Synthesis and Characterization of Tin(IV) Oxide Obtained by Chemical Vapor Deposition Method

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作者
Svitlana V. Nagirnyak
Victoriya A. Lutz
Tatiana A. Dontsova
Igor M. Astrelin
机构
[1] National Technical University of Ukraine “KPI”,Department of Chemistry
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Tin(IV) oxide; Tin(II) oxalate; CVD method; X-ray diffraction; Bandgap;
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摘要
The effect of precursors on the characteristics of tin oxide obtained by chemical vapor deposition (CVD) method was investigated. The synthesis of nanosized tin(IV) oxide was carried out with the use of two different precursors: tin(II) oxalate obtained using tin chloride(II) and oxalic acid; tin(II) oxalate obtained using tin chloride(II); and ammonium oxalate. The synthesized tin(IV) oxide samples were studied by electron microscopy, X-ray diffraction and optical spectra. The lattice parameters of tin(IV) oxide samples were defined, the bandgap of samples were calculated.
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