Effect of Si(100)-c(4 × 12)-Al and Si(111)-(5.55 × 5.55)-Cu reconstructions on the deposition of cobalt onto silicon surface

被引:0
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作者
D. A. Olyanich
D. N. Chubenko
D. V. Gruznev
V. G. Kotlyar
V. V. Ustinov
N. I. Solin
A. V. Zotov
A. A. Saranin
机构
[1] Far East Division of the Russian Academy of Sciences,Institute of Automation and Control Processes
[2] Russian Academy of Sciences,Institute of Metal Physics, Ural Branch
来源
Technical Physics Letters | 2010年 / 36卷
关键词
Technical Physic Letter; Silicon Surface; Surface Phase; Step Edge; Atomic Step;
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摘要
The use of surface reconstructions for modifying properties of single crystal silicon substrates with a view to the creation of new nanostructures is a promising direction in the development of nanotechnologies. Systems Si(100)-c(4 × 12)-Al and Si(111)-(5.55 × 5.55)-Cu occupy special positions among stable reconstructions of the silicon surface, which have been recently demonstrated to be promising templates. The adsorption of cobalt on these surfaces at various temperatures has been studied using scanning tunneling microscopy. The room-temperature deposition leads to the formation of a weakly ordered layer of metallic Co with retained initial reconstructions at the Co/Si interface. An increase in the temperature leads to the formation of faceted cobalt silicide islands on both reconstructed surfaces.
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页码:100 / 103
页数:3
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