Using scattered X-ray radiation for diagnostics of electron energy distribution in gyrotrons

被引:0
|
作者
A. V. Arkhipov
N. V. Dvoretskaya
O. I. Louksha
G. G. Sominskii
G. Gantenbein
A. Samartsev
机构
[1] St. Petersburg State Polytechnical University,Institute for Pulsed Power and Microwave Technology (IHM)
[2] Karlsruhe Institute of Technology,undefined
来源
Technical Physics Letters | 2015年 / 41卷
关键词
Technical Physic Letter; High Frequency Field; Karlsruhe Institute; Collector Surface; Diagnostic Window;
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中图分类号
学科分类号
摘要
We propose to use scattered X-ray radiation for determining the energy spectrum of electrons arriving at the collector of a gyrotron. It is shown that, under conditions typical of devices of this type, the radiation spectrum is almost not affected by the Compton scattering in the diagnostic window. An advantage of the proposed variant of diagnostics (in comparison to that using the direct X-ray flux) is related to optimization of the radiation flux density for the use of energy-dispersive spectrometers. A new scheme of measurements has been tested that allows data averaged over the entire electron beam of a gyrotron to be obtained. The possibility of gaining information with optimum spatial resolution is discussed.
引用
收藏
页码:60 / 64
页数:4
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