Capacitively Enhanced Thermal Escape in Underdamped Josephson Junctions

被引：0
|
作者：
Y. Yoon
S. Gasparinetti
M. Möttönen
J. P. Pekola
机构：
[1] Aalto University,Low Temperature Laboratory
[2] Aalto University,Department of Applied Physics/COMP
来源：
Journal of Low Temperature Physics | 2011年 / 163卷
关键词：
Josephson junction; Phase diffusion; Thermal activation;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
We have studied experimentally the escape dynamics in underdamped capacitively shunted and unshunted Josephson junctions with submicroampere critical currents below 0.5 K temperatures. In the shunted junctions, thermal activation process was preserved up to the highest temperature where the escape in the unshunted junctions exhibits the phase diffusion. Our observations in the shunted junctions are in good agreement with the standard thermal activation escape, unlike the results in the unshunted junctions.
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页码：164 / 169
页数：5
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