Highly regular rosette-shaped cathodoluminescence in GaN self-assembled nanodisks and nanorods

被引:0
|
作者
Bijun Zhao
Mark Nicolas Lockrey
Naiyin Wang
Philippe Caroff
Xiaoming Yuan
Li Li
Jennifer Wong-Leung
Hark Hoe Tan
Chennupati Jagadish
机构
[1] The Australian National University,Department of Electronic Materials Engineering, Research School of Physics
[2] The Australian National University,Australian National Fabrication Facility, Research School of Physics
[3] Central South University,Hunan Key Laboratory for Supermicrostructure and Ultrafast Process, School of Physics and Electronics
[4] The Australian National University,ARC Centre of Excellence for Transformative Meta
[5] University of Technology Sydney,Optical Systems, Research School of Physics
[6] Present address: Microsoft Quantum Lab Delft,Present address: Microstructural Analysis Unit
来源
Nano Research | 2020年 / 13卷
关键词
metalorganic chemical vapor deposition (MOCVD); GaN nanorod; cathodoluminescence; yellow luminescence; non-radiative recombination;
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学科分类号
摘要
Self-assembled GaN nanorods were grown by metal-organic chemical vapor deposition. A highly regular rosette-shaped cathodoluminescence pattern in the GaN nanorods is observed, where its origin is helpful to deepen the understanding of GaN nanorod growth. The pattern forms at the very early stages of nanorod growth, which consists of yellow luminescence at the edges and the non-luminous region at six vertices of the hexagon. To clarify its origin, we carried out detailed cathodoluminescence studies, electron microscopy studies and nanoscale secondary ion mass spectrometry at both the nanorod surface and cross-section. We found the pattern is not related to optical resonance modes or polarity inversion, which are commonly reported in GaN nanostructures. After chemical composition and strain analysis, we found higher carbon and nitrogen cluster concentration and large compressive strain at the pattern area. The pattern formation may relate to facet preferential distribution of non-radiative recombination centers related to excess carbon/nitrogen. This work provides an insight into strain distribution and defect-related emission in GaN nanorod, which is critical for future optoelectronic applications.
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页码:2500 / 2505
页数:5
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