The properties of Pb1-xCaxTiO3 (x = 0–30) thin films for electromechanical and pyroelectric applications can be further improved if porous, low-dielectric constant layers are being used. The electric field dependent strain, piezoelectric coefficient, pyroelectric coefficient and the pyroelectric figure of merit were evaluated as a function of the Ca-content and relative density of the thin films. The heating-rate during the final anneal was observed to be the controlling parameter for the evolution of either dense or porous microstructures. Both 2-methoxyethanol and 1,3-propanediol based solution precursors were used for spin-coating platinized Si3N4/SiO2/Si wafers. Microstructure-property relationships and electrical properties concerning the domain mobility were examined.
机构:
Fine Ceram Res Assoc, Synergy Ceram Lab, Kita Ku, Nagoya, Aichi 462, JapanFine Ceram Res Assoc, Synergy Ceram Lab, Kita Ku, Nagoya, Aichi 462, Japan
Iijima, K
Niihara, K
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Fine Ceram Res Assoc, Synergy Ceram Lab, Kita Ku, Nagoya, Aichi 462, JapanFine Ceram Res Assoc, Synergy Ceram Lab, Kita Ku, Nagoya, Aichi 462, Japan
Niihara, K
FERROELECTRIC THIN FILMS VI,
1998,
493
: 453
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458
机构:
USA, Res Lab, Sensors & Electron Devices Directorate, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Electron Devices Directorate, Adelphi, MD 20783 USA
Deb, KK
Tamagawa, T
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机构:USA, Res Lab, Sensors & Electron Devices Directorate, Adelphi, MD 20783 USA
Tamagawa, T
Di, Y
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机构:USA, Res Lab, Sensors & Electron Devices Directorate, Adelphi, MD 20783 USA
Di, Y
Gui, G
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机构:USA, Res Lab, Sensors & Electron Devices Directorate, Adelphi, MD 20783 USA
Gui, G
Halpern, BL
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机构:USA, Res Lab, Sensors & Electron Devices Directorate, Adelphi, MD 20783 USA
Halpern, BL
Schmitt, JJ
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机构:USA, Res Lab, Sensors & Electron Devices Directorate, Adelphi, MD 20783 USA