Tetragonal structure of thin nickel films on Cu(001)

被引：0

作者：

P. Le Fèvre

H. Magnan

D. Chandesris

机构：

[1] Université Paris-Sud,Laboratoire pour l'Utilisation du Rayonnement Électromagnétique

[2] Commissariat à l'Énergie Atomique,undefined

[3] Service de Recherche sur les Surfaces et l'Irradiation de la Matière,undefined

来源：

The European Physical Journal B - Condensed Matter and Complex Systems | 1999年 / 10卷

关键词：

PACS. 68.55.-a Thin film structure and morphology - 75.70.Ak Magnetic properties of monolayers and thin films - 68.35.Ja Surface and interface dynamics and vibrations;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The crystallographic structure of thin Ni films deposited on Cu(001) has been studied using Surface Extended X-ray Absorption Fine Structure (SEXAFS). Taking advantage of the linear polarization of the synchrotron radiation, we have shown that Ni adopts the Cu lattice parameter parallel to the interface. This lateral expansion induces a longitudinal compression of the unit cell, leading to a face centered tetragonal structure of the Ni films from 3 to 10 monolayers. The temperature dependence of the EXAFS oscillations has allowed to measure strain inside the Ni layers.

引用

页码：555 / 562

页数：7

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