Time-resolved transmission electron microscopy for nanoscale chemical dynamics

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作者
Francis M. Alcorn
Prashant K. Jain
Renske M. van der Veen
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[1] University of Illinois Urbana-Champaign,Department of Chemistry and Materials Research Laboratory
[2] Helmholtz Center Berlin for Materials and Energy,Department of Atomic
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The ability of transmission electron microscopy (TEM) to image a structure ranging from millimetres to Ångströms has made it an indispensable component of the toolkit of modern chemists. TEM has enabled unprecedented understanding of the atomic structures of materials and how structure relates to properties and functions. Recent developments in TEM have advanced the technique beyond static material characterization to probing structural evolution on the nanoscale in real time. Accompanying advances in data collection have pushed the temporal resolution into the microsecond regime with the use of direct-electron detectors and down to the femtosecond regime with pump–probe microscopy. Consequently, studies have deftly applied TEM for understanding nanoscale dynamics, often in operando. In this Review, time-resolved in situ TEM techniques and their applications for probing chemical and physical processes are discussed, along with emerging directions in the TEM field.
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页码:256 / 272
页数:16
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