Structural and thermoelectric properties in (Sb1-xBix)2Te3 thin films

被引:0
|
作者
S. Cho
Y. Kim
J.B. Ketterson
机构
[1] University of Ulsan,Department of Physics
[2] Kwangwoon University,Department of Electrophysics
[3] Northwestern University,Department of Physics and Astronomy
来源
Applied Physics A | 2004年 / 79卷
关键词
Thin Film; Diffraction Pattern; Carrier Concentration; Thermoelectric Property; Thermoelectric Power;
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学科分类号
摘要
We have investigated the structural and thermoelectric properties of (Sb1-xBix)2Te3 thin films on CdTe(111)B. Analysis of X-ray diffraction patterns (θ–2θ scans and rocking curves) of the films shows that they are of high quality and that they are well aligned with their (00.1) axis normal to the substrates. Measurements of the temperature-dependent thermoelectric power, resistivity, and Hall coefficient of the films were performed with respect to the binary composition, x. For the samples in the range 0.2<x<0.3, the room-temperature thermopower values were in the range 159–184 μV/K, the room-temperature carrier concentrations were 3.93–5.13×1019 cm-3, and the room-temperature mobilities were 24.6–64.0 cm2 V-1 s-1.
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页码:1729 / 1731
页数:2
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