Atomic force microscopy and photoluminescence analysis of porous metal-oxide materials

被引：0
|
作者：
S. A. Tarasov
I. E. Gracheva
K. G. Gareev
O. E. Gordyushenkov
I. A. Lamkin
E. A. Men’kovich
V. A. Moshnikov
A. V. Presnyakova
机构：
[1] St. Petersburg State Electrotechnical University “LETI”,
来源：
Semiconductors | 2012年 / 46卷
关键词：
Nickel Oxide; Indium Oxide; Orthosilicic Acid; Atomic Force Microscopy Technique; Iron Oxide Layer;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The results of studies of porous materials based on various metal oxides (Fe2O3, ZnO, In2O3, etc.) by photoluminescence analysis and atomic force microscopy are reported. The influence of the composition and structure of metal-oxide nanocomposites on features of the photoluminescence and optical transmittance spectra is considered.
引用
收藏
页码：1584 / 1588
页数：4
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