Imaging of a Suspended Helium Film with 2-D Electrons by Interferometry

被引：0
|
作者：
A.M.C. Valkering
J. Klier
E. Teske
R.W. van Der Heijden
P. Leiderer
机构：
[1] Eindhoven University of Technology,Department of Physics
[2] Universität Konstanz,Fakultät für Physik
来源：
Journal of Low Temperature Physics | 1998年 / 113卷
关键词：
Helium; Magnetic Material; Transport Property; Electron System; Electrical Transport;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A helium film suspended between elevations on a substrate forms an excellent surface for a two-dimensional electron gas. With the structure on the substrate a quasi one-dimensional electron system can be created. Experiments probing the electrical transport properties of this system have raised questions about the suspended helium film itself. We report measurements of the suspended film using interferometry. The profile is mapped out as a function of the bulk helium level beneath the substrate. By measuring the electron signal simultaneously the relation between the signal and the film profile can be obtained.
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页码：1115 / 1120
页数：5
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