A Review of Speckle Pattern Fabrication and Assessment for Digital Image Correlation

被引:1
|
作者
Y.L. Dong
B. Pan
机构
[1] Beihang University,Institute of Solid Mechanics
来源
Experimental Mechanics | 2017年 / 57卷
关键词
Digital image correlation; Speckle pattern; Micro/Nano-scale; Deformation measurement;
D O I
暂无
中图分类号
学科分类号
摘要
As a carrier of deformation information, the speckle pattern, or more exactly the random intensity distributions, which could be naturally occurred or artificially fabricated onto test samples’ surface, plays an indispensable role in digital image correlation (DIC). It is now well recognized that the accuracy and precision in DIC measurements not only rely on correlation algorithms, but also depend highly on the quality of the speckle pattern. Considering the huge diversity in test materials, spatial scales and experimental conditions, speckle pattern fabrication could be a challenging issue facing DIC practitioners. To obtain good speckle patterns suitable for DIC measurements, some key issues of fabrication methods and quality assessment of speckle patterns must be well addressed. To this end, this review systematically presents the speckle pattern classification and fabrication techniques for various samples and scales, as well as some typical quality assessment metrics.
引用
收藏
页码:1161 / 1181
页数:20
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