Efficient Totally Self-Checking Shifter Design

被引：0
|
作者：
Ricardo O. Duarte
M. Nicolaidis
H. Bederr
Y. Zorian
机构：
[1] Reliable Integrated Systems Group,
[2] Texas Instruments,undefined
[3] LogicVision,undefined
来源：
Journal of Electronic Testing | 1998年 / 12卷
关键词：
self-checking circuits; on-line testing; parity prediction; fault-secure circuits;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Self-checking designs will gain increasing interest in industrial applications if they satisfy the following requirements: high fault coverage, reduced hardware cost and reduced design effort. This work is aimed to reach these requirements for the design of self-checking shifters and is part of a broader project concerning the design of self-checking data paths.
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页码：29 / 39
页数：10
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