Analysis of the high-frequency response of atomic force microscope cantilevers

被引：0
|
作者：
U. Rabe
J. Turner
W. Arnold
机构：
[1] Fraunhofer Institut für zerstörungsfreie Prüfverfahren (IzfP),
[2] Universität,undefined
[3] Geb. 37,undefined
[4] D-66123 Saarbrücken,undefined
[5] Germany (Fax: +49-681-30693,undefined
[6] Email: rabe@izfp.fhg.de),undefined
来源：
Applied Physics A | 1998年 / 66卷
关键词：
Atomic Force Microscope; Atomic Force Microscope Cantilever; Force Microscope Cantilever;
D O I：
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中图分类号：
学科分类号：
摘要：
引用
收藏
页码：S277 / S282
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