Controlled strong excitation of silicon as a step towards processing materials at sub-nanometer precision

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作者
Thanh-Hung Dinh
Nikita Medvedev
Masahiko Ishino
Toshiyuki Kitamura
Noboru Hasegawa
Tomohito Otobe
Takeshi Higashiguchi
Kazuyuki Sakaue
Masakazu Washio
Tadashi Hatano
Akira Kon
Yuya Kubota
Yuichi Inubushi
Shigeki Owada
Tatsunori Shibuya
Beata Ziaja
Masaharu Nishikino
机构
[1] National Institutes for Quantum and Radiological Science and Technology (QST),Kansai Photon Science Institute
[2] Institute of Physics CAS,Group of EUV Ultra
[3] v.v.i.,precision Technology
[4] Institute of Plasma Physics CAS,Department of Electrical and Electronic Engineering, Faculty of Engineering
[5] v.v.i.,Photon Science Center
[6] QST Advanced Study Laboratory,Waseda Research Institute for Science and Engineering
[7] Utsunomiya University,Institute of Multidisciplinary Research for Advanced Materials
[8] The University of Tokyo,Research Institute for Measurement and Analytical Instrumentation (RIMA), National Metrology Institute of Japan (NMIJ)
[9] Waseda University,Center for Free
[10] Tohoku University,Electron Laser Science CFEL
[11] Japan Synchrotron Radiation Research Institute,Institute of Nuclear Physics
[12] RIKEN SPring-8 Center,undefined
[13] National Institute of Advanced Industrial Science and Technology (AIST),undefined
[14] Deutsches Elektronen-Synchrotron DESY,undefined
[15] Polish Academy of Sciences,undefined
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摘要
Interaction of a solid material with focused, intense pulses of high-energy photons or other particles (such as electrons and ions) creates a strong electronic excitation state within an ultra-short time and on ultra-small spatial scales. This offers the possibility to control the response of a material on a spatial scale less than a nanometer—crucial for the next generation of nano-devices. Here we create craters on the surface of a silicon substrate by focusing single femtosecond extreme ultraviolet pulse from the SACLA free-electron laser. We investigate the resulting surface modification in the vicinity of damage thresholds, establishing a connection to microscopic theoretical approaches, and, with their help, illustrating physical mechanisms for damage creation. The cooling during ablation by means of rapid electron and energy transport can suppress undesired hydrodynamical motions, allowing the silicon material to be directly processed with a precision reaching the observable limitation of an atomic force microscope.
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