Influence of the Substrate Material on the Structure and Morphological Properties of Bi Films

被引：0
|
作者：
S. Zouaghi
H. Fitouri
M. M. Habchi
E. Abdullah Ashaya
A. Rebey
机构：
[1] Research Laboratory on Hetero-Epitaxy and Applications,
[2] Faculty of Sciences of Monastir,undefined
[3] University of Monastir,undefined
[4] Department of Physics,undefined
[5] College of Science,undefined
[6] Qassim University,undefined
来源：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques | 2022年 / 16卷
关键词：
bismuth; thin films; scanning electron microscopy; high resolution X-ray diffraction; spectroscopic ellipsometry;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：783 / 788
页数：5
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