Electron aspirator using electron–electron scattering in nanoscale silicon

被引:0
|
作者
Himma Firdaus
Tokinobu Watanabe
Masahiro Hori
Daniel Moraru
Yasuo Takahashi
Akira Fujiwara
Yukinori Ono
机构
[1] Shizuoka University,Graduate School of Science and Technology
[2] Shizuoka University,Research Institute of Electronics
[3] Hokkaido University,Graduate School of Information Science and Technology
[4] NTT Basic Research Laboratories,undefined
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
Current enhancement without increasing the input power is a critical issue to be pursued for electronic circuits. However, drivability of metal-oxide-semiconductor (MOS) transistors is limited by the source-injection current, and electrons that have passed through the source unavoidably waste their momentum to the phonon bath. Here, we propose the Si electron-aspirator, a nanometer-scaled MOS device with a T-shaped branch, to go beyond this limit. The device utilizes the hydrodynamic nature of electrons due to the electron–electron scattering, by which the injected hot electrons transfer their momentum to cold electrons before they relax with the phonon bath. This momentum transfer induces an electron flow from the grounded side terminal without additional power sources. The operation is demonstrated by observing the output-current enhancement by a factor of about 3 at 8 K, which reveals that the electron–electron scattering can govern the electron transport in nanometer-scaled MOS devices, and increase their effective drivability.
引用
收藏
相关论文
共 50 条
  • [1] Electron aspirator using electron-electron scattering in nanoscale silicon
    Firdaus, Himma
    Watanabe, Tokinobu
    Hori, Masahiro
    Moraru, Daniel
    Takahashi, Yasuo
    Fujiwara, Akira
    Ono, Yukinori
    NATURE COMMUNICATIONS, 2018, 9
  • [2] Silicon Electron Nano-Aspirator - Current enhancement based on electron-electron scattering
    Ono, Yukinori
    2023 SILICON NANOELECTRONICS WORKSHOP, SNW, 2023, : 85 - 86
  • [3] Electron scattering from silicon
    Gedeon, Viktor
    Gedeon, Sergej
    Lazur, Vladimir
    Nagy, Elizabeth
    Zatsarinny, Oleg
    Bartschat, Klaus
    PHYSICAL REVIEW A, 2012, 85 (02):
  • [4] ELECTRON SCATTERING ANISOTROPY IN SILICON
    Gaidar, G. P.
    Baranskii, P., I
    JOURNAL OF PHYSICAL STUDIES, 2021, 25 (01):
  • [5] ELECTRON ELECTRON-SCATTERING IN SILICON INVERSION-LAYERS
    DAVIES, RA
    PEPPER, M
    JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1983, 16 (12): : L353 - L360
  • [6] ONE-DIMENSIONAL ELECTRON LOCALIZATION AND CONDUCTION BY ELECTRON ELECTRON-SCATTERING IN NARROW SILICON
    DEAN, CC
    PEPPER, M
    JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (31): : 5663 - 5676
  • [7] Scattering of Å-scale electron probes in silicon
    Dwyer, C
    Etheridge, J
    ULTRAMICROSCOPY, 2003, 96 (3-4) : 343 - 360
  • [8] Interference in electron Compton scattering for silicon
    Exner, A
    Kohl, H
    Nelhiebel, M
    Schattschneider, P
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1996, 8 (16) : 2835 - 2850
  • [9] ELECTRON SCATTERING BY PAIR PRODUCTION IN SILICON
    KANE, EO
    PHYSICAL REVIEW, 1967, 159 (03): : 624 - &
  • [10] Effect of electron-electron scattering at an elevated temperature on device lifetime of nanoscale nMOSFETs
    Lee, Seonhaeng
    Kim, Dongwoo
    Kim, Cheolgyu
    Lee, N-H.
    Kim, G-J
    Lee, Chiho
    Park, Jeongsoo
    Kang, Bongkoo
    MICROELECTRONICS RELIABILITY, 2012, 52 (9-10) : 1905 - 1908