Quantitative analysis of nanoscale deformation fields of a crack-tip in single-crystal silicon

被引：0
|
作者：
ChunWang Zhao
YongMing Xing
机构：
[1] Inner Mongolia University of Technology,College of Science
来源：
Science China Physics, Mechanics and Astronomy | 2012年 / 55卷
关键词：
crack-tip; strain; high-resolution transmission electron microscopy; geometric phase analysis;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A mode II crack in single-crystal silicon was investigated experimentally using high-resolution transmission electron microscopy. Geometric phase analysis and numerical moiré method were employed to map the deformation fields of the crack-tip area. The normal strain field maps of the crack-tip area indeed showed the deformation occurs primarily in the vicinity of the dislocations and the normal strains are near zero in the crack-tip area. The shear strain field map shows that the relatively large shear strain is in the crack-tip area. The experimental results were compared with the predictions of linear elastic fracture mechanics. The comparison shows that measured strain distribution ahead of the crack-tip agrees with the predictions of linear elastic fracture mechanics up to 1 nm from the crack-tip.
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页码：1088 / 1092
页数：4
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