Two-phase edge outlier detection method for technology opportunity discovery

被引：3

作者：

Byunghoon Kim

Gianluca Gazzola

Jaekyung Yang

Jae-Min Lee

Byoung-Youl Coh

Myong K. Jeong

Young-Seon Jeong

机构：

[1] Korea Institute of Science and Technology Information,Technology Commercialization Analysis Center

[2] Rutgers Business School,Rutgers Center for Operations Research

[3] Chonbuk National University,Department of Industrial and Information Systems Engineering

[4] Korea Institute of Science and Technology Information,Future Information Research Center

[5] Rutgers University,Department of Industrial and Systems Engineering

[6] Chonnam National University,Department of Industrial Engineering

来源：

Scientometrics | 2017年 / 113卷

关键词：

Edge outlier; Outlier detection; Technology convergence; Technology opportunity discovery; Patent citation network;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

This article introduces a method for identifying potential opportunities of innovation arising from the convergence of different technological areas, based on the presence of edge outliers in a patent citation network. Edge outliers are detected via the assessment of their centrality; pairs of patents connected by edge outliers are then analyzed for technological relatedness and past involvement in technological convergence. The pairs with the highest potential for future convergence are finally selected and their keywords combined to suggest new directions of innovation. We illustrate our method on a data set of US patents in the field of digital information and security.

引用

页码：1 / 16

页数：15

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