X-ray Diffraction Analysis of the Structure In0.53Ga0.47As Films Grown on (100) and (111)A GaAs Substrates with a Metamorphic Buffer

被引：0
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作者：
M. S. Folomeshkin
Yu. A. Volkovsky
P. A. Prosekov
G. B. Galiev
E. A. Klimov
A. N. Klochkov
S. S. Pushkarev
A. Yu. Seregin
Yu. V. Pisarevsky
A. E. Blagov
M. V. Kovalchuk
机构：
[1] Shubnikov Institute of Crystallography,
[2] Federal Scientific Research Centre “Crystallography and Photonics,undefined
[3] ” Russian Academy of Sciences,undefined
[4] National Research Centre “Kurchatov Institute”,undefined
[5] Mokerov Institute of Ultra High Frequency Semiconductor Electronics,undefined
[6] Russian Academy of Sciences,undefined
[7] St. Petersburg State University,undefined
来源：
Crystallography Reports | 2022年 / 67卷
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页码：317 / 322
页数：5
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