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- [1] COMMON TTCN-3 CODEC TO REDUCE TEST ENGINEERING COST PROCEEDINGS OF THE 2010 INTERNATIONAL CONFERENCE ON ADVANCED INTELLIGENCE AND AWARENESS INTERNET, AIAI2010, 2010, : 333 - 336
- [2] Automatic Generation of Cost-Effective Test Oracles 36TH INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING (ICSE COMPANION 2014), 2014, : 678 - 681
- [3] Automatic test pattern generation using trapezium reduce algorithm ICEMI '97 - CONFERENCE PROCEEDINGS: THIRD INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, 1997, : 99 - 104
- [4] Low Cost Automatic Test Vector Generation for Structural Analog Testing 2017 18TH IEEE LATIN AMERICAN TEST SYMPOSIUM (LATS 2017), 2017,
- [5] Zero cost test point insertion technique to reduce test set size and test generation time for structured ASICs PROCEEDINGS OF THE 15TH ASIAN TEST SYMPOSIUM, 2006, : 339 - +
- [8] Automatic test generation with AGATHA TOOLS AND ALGORITHMS FOR THE CONSTRUCTION AND ANALYSIS OF SYSTEMS, PROCEEDINGS, 2003, 2619 : 591 - 596