Influence of a flux of high-velocity microparticles on the parameters of integrated circuits placed behind a thick-walled obstacle

被引:0
|
作者
Belous A.I. [1 ]
Dybov O.A. [2 ]
Romanov G.S. [3 ]
Petlitskaya T.V. [1 ]
Usov G.I. [1 ]
机构
[1] Belmikrosistemy Unitary Enterprise, Minsk
[2] Scientific-Research Institute of Pulsed Processes with Pilot Production, Minsk
[3] A. V. Luikov Heat and Mass Transfer Institute, National Academy of Sciences of Belarus, Minsk, 220072
关键词
Experimental Data; Statistical Physic; Integrate Circuit; Space Particle; Metal Obstacle;
D O I
10.1023/B:JOEP.0000045161.32924.c8
中图分类号
学科分类号
摘要
Experimental data showing that on collision of a flux of high-velocity microparticles (which is close to the fluxes of space particles in parameters) with a thick-walled metal obstacle we have failure of integrated circuits placed behind this obstacle have been given. © 2004 Springer Science+Business Media, Inc.
引用
收藏
页码:773 / 775
页数:2
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