Mass balance method for purity assay of phthalic acid esters: development of primary reference materials as traceability sources in the Japan Calibration Service System
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作者:
Keiichiro Ishikawa
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机构:National Metrology Institute of Japan (NMIJ),
Keiichiro Ishikawa
Nobuyasu Hanari
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机构:National Metrology Institute of Japan (NMIJ),
Nobuyasu Hanari
Yoshitaka Shimizu
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机构:National Metrology Institute of Japan (NMIJ),
Yoshitaka Shimizu
Toshihide Ihara
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机构:National Metrology Institute of Japan (NMIJ),
Toshihide Ihara
Akira Nomura
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机构:National Metrology Institute of Japan (NMIJ),
Akira Nomura
Masahiko Numata
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机构:National Metrology Institute of Japan (NMIJ),
Masahiko Numata
Takashi Yarita
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机构:National Metrology Institute of Japan (NMIJ),
Takashi Yarita
Kenji Kato
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机构:National Metrology Institute of Japan (NMIJ),
Kenji Kato
Koichi Chiba
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机构:National Metrology Institute of Japan (NMIJ),
Koichi Chiba
机构:
[1] National Metrology Institute of Japan (NMIJ),
[2] National Institute of Advanced Industrial Science and Technology (AIST),undefined
Certified reference material;
Phthalic acid ester;
Purity;
Japan Calibration Service System;
Mass balance method;
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摘要:
Purity assay of high-purity materials (HPMs) of phthalic acid esters (PAEs) was carried out by means of a mass balance method. In this method, chromatographic methods such as gas chromatography-flame ionization detector (GC-FID) and/or high-performance liquid chromatography (HPLC) in combination with other methods such as Karl-Fischer (KF) titration and vacuum evaporation (VE) were applied. The sum of the impurities estimated by these methods allowed the estimation of the purity of the main component by difference. Seven PAEs with varying side chain structures and levels of impurities were analysed on a systematic way in which impurities were classified into several groups in terms of their abundance, availability of qualitative information and availability of authentic compounds, etc. The absolute quantity of each impurity was determined by GC-FID and/or HPLC based on the calibration made by the authentic compounds of impurities whenever available. The purities in mass fraction of these PAEs were certified at the National Metrology Institute of Japan (NMIJ), and the PAEs were registered as primary reference materials playing an essential role in linking the metrological traceability of the Japan Calibration Service System (JCSS) to the International System of Units (SI).