Quantitative determination of PGM using ICP-MS, ICP-AES, AAS and XRF

被引:0
|
作者
H. Yoon
C. Yoon
C. S. Park
T. Ko
N. S. Kim
K. N. Han
机构
[1] Korea Basic Science Institute - Seoul Branch,Dept of Materials Science
[2] Inha University,Dept. of Materials and Metallurgical Engineering
[3] South Dakota School of Mines and Technology,undefined
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关键词
Quantitative analysis; Platinum group metals; Atomic adsorption; Inductively coupled plasma; X-ray fluorescence;
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摘要
The quantitative determination of platinum group metals from ore samples and industrial materials using inductively coupled plasma-mass spectrometer (ICP-MS), inductively coupled plasma-atomic emission spectrometer (ICP-AES), atomic absorption spectrometer (AAS) and X-ray fluorescence (XRF) techniques was conducted, and the performance of these techniques was compared. The ICP-AES technique exhibited better accuracy than AAS but showed limitations in its application due to strong spectral interference in the presence of common matrix elements such as iron. The ICP-MS showed the lowest detection limit and less spectral interference than the previous two techniques. The XRF technique was also applied to examine the total amount of PGM from industrial materials. Results from each analytical method on various sources were presented and discussed.
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页码:59 / 64
页数:5
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