Investigation of surface changes on mica induced by atomic force microscopy imaging under liquids

Surface changes on muscovite mica induced by tip-surface interactions in atomic force microscopy (AFM) experiments under liquids are described. Investigations have been performed with AFM operated both in contact mode (CM-AFM) and in tapping mode (TM-AFM). Additionally, force-distance measurements have been carried out. In contrast to CM-AFM pronounced surface changes can be observed in TM-AFM experiments. However, TM-AFM images of areas previously scanned in contact mode show that imaging in contact mode changes the surface, too. An evaluation of force-distance measurements reveals that these changes depend on the adhesive interaction between tip and sample, which in turn strongly depends on the surrounding medium. The artefact can be avoided by changing the pH-value of the medium or by working with mixtures of ethanol and water. This greatly enhances the applicability of TM-AFM for in-situ investigation of surface processes on mica, which is a frequently used substrate for many technological and biological applications.