Fullerenes as the imaging element of the tip of an atomic force microscope

被引：0
|
作者：
G. V. Dedkov
机构：
[1] Kabardino-Balkarsk State University,
来源：
Technical Physics Letters | 1997年 / 23卷
关键词：
Graphite; Atomic Force Microscope; Fullerene; Computer Image; Test Computer;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
It is proposed that the C60 molecule be used as the imaging element of the tip of an atomic force microscope. Test computer images are obtained of portions of a distorted graphite surface and a graphite surface with vacancies.
引用
收藏
页码：469 / 471
页数：2
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