Towards a quantitative determination of strain in Bragg Coherent X-ray Diffraction Imaging: artefacts and sign convention in reconstructions

被引:0
|
作者
Jérôme Carnis
Lu Gao
Stéphane Labat
Young Yong Kim
Jan P. Hofmann
Steven J. Leake
Tobias U. Schülli
Emiel J. M. Hensen
Olivier Thomas
Marie-Ingrid Richard
机构
[1] Aix Marseille Université,
[2] CNRS,undefined
[3] Université de Toulon,undefined
[4] ID01/ESRF,undefined
[5] The European Synchrotron,undefined
[6] Laboratory for Inorganic Materials and Catalysis,undefined
[7] Department of Chemical Engineering and Chemistry,undefined
[8] Deutsches Elektronen-Synchrotron (DESY),undefined
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
Bragg coherent X-ray diffraction imaging (BCDI) has emerged as a powerful technique to image the local displacement field and strain in nanocrystals, in three dimensions with nanometric spatial resolution. However, BCDI relies on both dataset collection and phase retrieval algorithms that can induce artefacts in the reconstruction. Phase retrieval algorithms are based on the fast Fourier transform (FFT). We demonstrate how to calculate the displacement field inside a nanocrystal from its reconstructed phase depending on the mathematical convention used for the FFT. We use numerical simulations to quantify the influence of experimentally unavoidable detector deficiencies such as blind areas or limited dynamic range as well as post-processing filtering on the reconstruction. We also propose a criterion for the isosurface determination of the object, based on the histogram of the reconstructed modulus. Finally, we study the capability of the phasing algorithm to quantitatively retrieve the surface strain (i.e., the strain of the surface voxels). This work emphasizes many aspects that have been neglected so far in BCDI, which need to be understood for a quantitative analysis of displacement and strain based on this technique. It concludes with the optimization of experimental parameters to improve throughput and to establish BCDI as a reliable 3D nano-imaging technique.
引用
收藏
相关论文
共 50 条
  • [1] Towards a quantitative determination of strain in Bragg Coherent X-ray Diffraction Imaging: artefacts and sign convention in reconstructions
    Carnis, Jerome
    Gao, Lu
    Labat, Stephane
    Kim, Young Yong
    Hofmann, Jan P.
    Leake, Steven J.
    Schulli, Tobias U.
    Hensen, Emiel J. M.
    Thomas, Olivier
    Richard, Marie-Ingrid
    SCIENTIFIC REPORTS, 2019, 9 (1)
  • [2] The influence of strain on image reconstruction in Bragg coherent X-ray diffraction imaging and ptychography
    Kim, Chan
    Scholz, Markus
    Madsen, Anders
    JOURNAL OF SYNCHROTRON RADIATION, 2021, 28 : 1159 - 1165
  • [3] Coherent X-ray diffraction imaging of strain at the nanoscale
    Robinson, Ian
    Harder, Ross
    NATURE MATERIALS, 2009, 8 (04) : 291 - 298
  • [4] Coherent X-ray diffraction imaging of strain at the nanoscale
    Ian Robinson
    Ross Harder
    Nature Materials, 2009, 8 : 291 - 298
  • [5] Strain Imaging at the Nanoscale with Coherent X-ray Diffraction
    Chamard, Virginie
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2009, 65 : S65 - S65
  • [6] Refinements for Bragg coherent X-ray diffraction imaging: electron backscatter diffraction alignment and strain field computation
    Yang, David
    Lapington, Mark T.
    He, Guanze
    Song, Kay
    Zhang, Minyi
    Barker, Clara
    Harder, Ross J.
    Cha, Wonsuk
    Liu, Wenjun
    Phillips, Nicholas W.
    Hofmann, Felix
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2022, 55 (05) : 1184 - 1195
  • [7] On the use of the scattering amplitude in coherent X-ray Bragg diffraction imaging
    Godard, Pierre
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2021, 54 : 797 - 802
  • [8] Coherent X-Ray Diffraction Imaging of Morphology and Strain in Nanomaterials
    Harder, Ross
    Robinson, Ian K.
    JOM, 2013, 65 (09) : 1202 - 1207
  • [9] Coherent X-Ray Diffraction Imaging of Morphology and Strain in Nanomaterials
    Ross Harder
    Ian K. Robinson
    JOM, 2013, 65 : 1202 - 1207
  • [10] Towards Imaging of Topological Defects by Coherent X-Ray Diffraction
    Jacques, Vincent
    Le Bolloc'h, David
    Ravy, Sylvain
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2009, 65 : S66 - S66