Effect of non-strained capping layer on excess stress in strained layers

被引：0
|
作者：
Zhi Jin
Shuren Yang
Chunsheng Ma
Haiyan An
Benzhong Wang
Shiyong Liu
机构：
[1] Jilin University,State Key Laboratory of Integrated Optoelectronics, Department of Electrical Engineering
来源：
Science in China Series A: Mathematics | 1999年 / 42卷
关键词：
non-strained capping-layer; excess stress; mechanism of the mixture of the dislocations;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The effects of the capping-layer thickness and the discrepancy of the numbers of misfit dislocations at the upper and lower interfaces in capped layer on the excess stress are considered. Based on this, the formulae of excess stresses for single-and double-kink models are modified and a new formula is derived, which unifies single- and doublekink models and is valid for arbitrary capping-layer thickness. It is useful to complete the description of the formation and motion of misfit dislocations in strained layers.
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页码：523 / 527
页数：4
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