Measurement and Metrology in Advanced Manufacturing Processes

被引：0
|
作者：
Pavan Kumar Kankar
Girija Moona
Kaushal A. Desai
机构：
[1] Indian Institute of Technology Indore,System Dynamics Lab, Department of Mechanical Engineering
[2] CSIR-National Physical Laboratory,Length, Dimension and Nano Metrology
[3] Academy of Scientific and Innovative Research (AcSIR),Department of Mechanical Engineering
[4] CSIR-HRDC Campus,undefined
[5] Indian Institute of Technology Jodhpur,undefined
来源：
MAPAN | 2022年 / 37卷
关键词：
Advanced manufacturing process; Additive manufacturing; Metrology; Sensor; Measurement;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
New and improved measurement methods are paramount to ensure in-process monitoring of advanced manufacturing processes and quality products. This editorial discusses the outline of the special issue consisting of 15 peer-reviewed manuscripts in the domain of "Measurement and Metrology in Advanced Manufacturing Processes." These research and review articles discuss the relevance, state-of-the-art methods, and ongoing research on the advancement of manufacturing processes with measurements and metrology perspectives by different research groups globally. The significance of measurement and metrology is recognized in various applications such as additive manufacturing, photopolymer jetting, submerged arc welding, micro-electrical discharge machining, and reverse manufacturing.
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收藏
页码：703 / 705
页数：2
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