Mesoscopic variance of dislocation displacements in semiconductor crystals

被引:0
|
作者
B. V. Petukhov
机构
[1] Russian Academy of Sciences,Shubnikov Institute of Crystallography
来源
Semiconductors | 2010年 / 44卷
关键词
Disloca Tion; Semiconductor Crystal; Dislocation Dynamic; Mesoscopic Level; Profile Width;
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中图分类号
学科分类号
摘要
It is shown that a large variance of dislocation displacements found experimentally and the delay in its relaxation to a steady value in semiconductor materials can be explained by the stochastic nature of the dislocation-kink formation. This stochastic nature results in the development of dislocation-line roughness described by the scaling relations, including the mesoscopic time and space scales.
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页码:1258 / 1262
页数:4
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