Microstructural Investigations in Metals Using Atom Probe Tomography with a Novel Specimen-Electrode Geometry

被引：0

作者：

David J. Larson

Robert M. Ulfig

Dan R. Lenz

Joseph H. Bunton

Jeff D. Shepard

Timothy R. Payne

Katherine P. Rice

Yimeng Chen

Ty J. Prosa

Dan J. Rauls

Thomas F. Kelly

Niyanth Sridharan

Suresh Babu

机构：

[1] CAMECA Instruments Inc.,Material Science and Technology Division

[2] Oak Ridge National Laboratory,undefined

[3] University of Tennessee,undefined

来源：

JOM | 2018年 / 70卷

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

A new atom probe design is presented along with data showing spectral performance and selected microstructural characterization examples. The instrument includes a curved reflectron, a 532-nm laser, and an integrated, fixed-position, counter electrode in a configuration with moderate electric field enhancement that includes improvements in ease of use and cost of ownership. Both voltage-pulsed and laser-pulsed performance is shown for a variety of materials including Al, Si, W, 316 stainless steel, Inconel 718, and GaN. Characterization of grain boundaries and phase boundaries, including correlation with transmission electron backscatter diffraction results in Inconel 718, is shown. A detailed case study of the resultant microstructure between laser-beam and electron-beam additive manufacturing paths in Inconel 718 is also presented.

引用

页码：1776 / 1784

页数：8

共 50 条

[1] Microstructural Investigations in Metals Using Atom Probe Tomography with a Novel Specimen-Electrode Geometry
Larson, David J.
Ulfig, Robert M.
Lenz, Dan R.
Bunton, Joseph H.
Shepard, Jeff D.
Payne, Timothy R.
Rice, Katherine P.
Chen, Yimeng
Prosa, Ty J.
Rauls, Dan J.
Kelly, Thomas F.
Sridharan, Niyanth
Babu, Suresh
JOM, 2018, 70 (09) : 1776 - 1784
[2] Specimen preparation for atom probe tomography
Felfer, P.
Ott, B.
Vorlaufer, N.
PRAKTISCHE METALLOGRAPHIE-PRACTICAL METALLOGRAPHY, 2024, 61 (11): : 848 - 864
[3] Atom Probe Tomography Investigations of Microstructural Evolution in an Aged Nickel Superalloy for Exhaust Applications
Gardner, Hazel
Pedrazzini, Stella
Douglas, James O.
De Lille, Didier
Moody, Michael P.
Bagot, Paul A. J.
METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2019, 50A (04): : 1862 - 1872
[4] Atom Probe Tomography Investigations of Microstructural Evolution in an Aged Nickel Superalloy for Exhaust Applications
Hazel Gardner
Stella Pedrazzini
James O. Douglas
Didier De Lille
Michael P. Moody
Paul A. J. Bagot
Metallurgical and Materials Transactions A, 2019, 50 : 1862 - 1872
[5] Electrostatic simulations of a local electrode atom probe: The dependence of tomographic reconstruction parameters on specimen and microscope geometry
Loi, Shyeh Tjing
Gault, Baptiste
Ringer, Simon P.
Larson, David J.
Geiser, Brian P.
ULTRAMICROSCOPY, 2013, 132 : 107 - 113
[6] A Study of Parameters Affecting Atom Probe Tomography Specimen Survivability
Prosa, Ty J.
Strennen, Savanna
Olson, David
Lawrence, Dan
Larson, David J.
MICROSCOPY AND MICROANALYSIS, 2019, 25 (02) : 425 - 437
[7] Methodology exploration of specimen preparation for atom probe tomography from nanowires
Qu, Jiangtao
Wong, Derek
Du, Sichao
Yang, Limei
Ringer, Simon
Zheng, Rongkun
ULTRAMICROSCOPY, 2015, 159 : 427 - 431
[8] Atom probe tomography of SRAM transistors: Specimen preparation methods and analysis
Panciera, F.
Hoummada, K.
Gregoire, M.
Juhel, M.
Lorut, F.
Bicais, N.
Mangelinck, D.
MICROELECTRONIC ENGINEERING, 2013, 107 : 167 - 172
[9] Simulation of Specimen Structure in Atom Probe Tomography and Field Electron Microscopy
Nikiforov, K. A.
Egorov, N. V.
2015 INTERNATIONAL CONFERENCE ON MECHANICS SEVENTH POLYAKHOVS READING, 2015,
[10] In situ site-specific specimen preparation for atom probe tomography
Thompson, K.
Lawrence, D.
Larson, D. J.
Olson, J. D.
Kelly, T. F.
Gorman, B.
ULTRAMICROSCOPY, 2007, 107 (2-3) : 131 - 139

← 1 2 3 4 5 →