Contact line dynamics of a superhydrophobic surface: application for immersion lithography

被引:0
|
作者
Arun Kumar Gnanappa
Evangelos Gogolides
Fabrizio Evangelista
Michel Riepen
机构
[1] Institute of Microelectronics IMEL,
[2] NCSR ‘Demokritos’,undefined
[3] ASML,undefined
来源
关键词
Hydrophobic; Receding contact angle; Dynamic contact angle; Wetting; Water loss; Shedding;
D O I
暂无
中图分类号
学科分类号
摘要
The dynamic contact line behavior of water on nanotextured rough hydrophobic and superhydrophobic surfaces is studied and contrasted to smooth hydrophobic surfaces for application in immersion lithography. Liquid loss occurs at the receding meniscus when the smooth substrate is accelerated beyond a critical velocity of approximately 1 m/s. Nanotexturing the surface with average roughness values even below 10 nm results in critical velocity larger than 2.5 m/s, the upper limit of the apparatus. This unexpected increase in critical velocity is observed for both sticky hydrophobic and slippery superhydrophobic surfaces. The authors attribute this large increase in critical velocity both in increased receding contact angle and in increased slip length for such nanotextured surfaces.
引用
收藏
页码:1351 / 1357
页数:6
相关论文
共 50 条
  • [1] Contact line dynamics of a superhydrophobic surface: application for immersion lithography
    Gnanappa, Arun Kumar
    Gogolides, Evangelos
    Evangelista, Fabrizio
    Riepen, Michel
    MICROFLUIDICS AND NANOFLUIDICS, 2011, 10 (06) : 1351 - 1357
  • [2] Contact line and contact angle dynamics in superhydrophobic channels
    Zhang, Junfeng
    Kwok, Daniel Y.
    LANGMUIR, 2006, 22 (11) : 4998 - 5004
  • [3] Receding contact line dynamics on superhydrophobic surfaces
    Betti, Lorenzo
    Campos, Jordy Queiros
    Lechantre, Amandine
    Cailly-Brandstater, Lea
    Nouma, Sarra
    Fresnais, Jerome
    Barthel, Etienne
    Bouret, Yann
    Noblin, Xavier
    Cohen, Celine
    PHYSICAL REVIEW FLUIDS, 2025, 10 (02):
  • [4] Spectral analysis of line width roughness and its application to immersion lithography
    Lorusso, Gian Francesco
    Leunissen, Peter
    Ercken, Monique
    Delvaux, Christie
    Van Roey, Frieda
    Vandenbroeck, Nadia
    Yang, Hedong
    Azordegan, Amir
    DiBiase, Tony
    JOURNAL OF MICROLITHOGRAPHY MICROFABRICATION AND MICROSYSTEMS, 2006, 5 (03):
  • [5] Application of ellipsometry in immersion lithography
    Jeong, H.
    Cheon, H.
    Kyoung, J.
    Oh, H.
    An, I.
    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 5, 2008, 5 (05): : 1414 - 1418
  • [6] Drop spreading on a superhydrophobic surface: pinned contact line and bending liquid surface
    Wang, Yanbin
    Andrews, Joseph Eugene
    Hu, Liangbing
    Das, Siddhartha
    PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2017, 19 (22) : 14442 - 14452
  • [7] Microscopic Receding Contact Line Dynamics on Pillar and Irregular Superhydrophobic Surfaces
    Yong Han Yeong
    Athanasios Milionis
    Eric Loth
    Ilker S. Bayer
    Scientific Reports, 5
  • [8] Microscopic Receding Contact Line Dynamics on Pillar and Irregular Superhydrophobic Surfaces
    Yeong, Yong Han
    Milionis, Athanasios
    Loth, Eric
    Bayer, Ilker S.
    SCIENTIFIC REPORTS, 2015, 5
  • [9] Drop evaporation on superhydrophobic PTFE surfaces driven by contact line dynamics
    Ramos, S. M. M.
    Dias, J. F.
    Canut, B.
    JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2015, 440 : 133 - 139
  • [10] On the dynamics of contact line freezing of water droplets on superhydrophobic carbon soot coatings
    Esmeryan, Karekin D.
    Castano, Carlos E.
    Gyoshev, Stanislav D.
    Lazarov, Yuliyan
    Stoimenov, Nikolay I.
    Mohammadi, Reza
    CURRENT APPLIED PHYSICS, 2021, 31 : 74 - 86